1 Ocak 2019 Dergi makalesi Açık Erişim

Yurchenko, Vladimir; Navruz, Tugba; Ciydem, Mehmet; Altintas, Ayhan

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{
  "@context": "https://schema.org/", 
  "@id": 70489, 
  "@type": "ScholarlyArticle", 
  "creator": [
    {
      "@type": "Person", 
      "affiliation": "Gazi Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
      "name": "Yurchenko, Vladimir"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Gazi Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
      "name": "Navruz, Tugba"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Engitek Engn Technol Ltd, Ankara, Turkey", 
      "name": "Ciydem, Mehmet"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Bilkent Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
      "name": "Altintas, Ayhan"
    }
  ], 
  "datePublished": "2019-01-01", 
  "description": "We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetimes in high-resistivity semiconductor layers. We applied the method to undoped Si wafers of high resistivity, at 5 and 30 kOhm*cm, and measured conductivity relaxation times of 10 and 14 microseconds, respectively. In the wafers being considered, relaxation times are likely to be defined by the electron-hole diffusion from the bulk to the wafer surface.", 
  "headline": "Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon", 
  "identifier": 70489, 
  "image": "https://aperta.ulakbim.gov.tr/static/img/logo/aperta_logo_with_icon.svg", 
  "license": "http://www.opendefinition.org/licenses/cc-by", 
  "name": "Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon", 
  "url": "https://aperta.ulakbim.gov.tr/record/70489"
}