1 Ocak 2019 Dergi makalesi Açık Erişim

Yurchenko, Vladimir; Navruz, Tugba; Ciydem, Mehmet; Altintas, Ayhan

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        "affiliation": "Gazi Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
        "name": "Yurchenko, Vladimir"
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      {
        "affiliation": "Gazi Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
        "name": "Navruz, Tugba"
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      {
        "affiliation": "Engitek Engn Technol Ltd, Ankara, Turkey", 
        "name": "Ciydem, Mehmet"
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        "affiliation": "Bilkent Univ, Elect & Elect Engn Dept, Ankara, Turkey", 
        "name": "Altintas, Ayhan"
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    "description": "We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetimes in high-resistivity semiconductor layers. We applied the method to undoped Si wafers of high resistivity, at 5 and 30 kOhm*cm, and measured conductivity relaxation times of 10 and 14 microseconds, respectively. In the wafers being considered, relaxation times are likely to be defined by the electron-hole diffusion from the bulk to the wafer surface.", 
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      "issue": "2", 
      "pages": "101-107", 
      "title": "ADVANCED ELECTROMAGNETICS", 
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    "title": "Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon"
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