1 Ocak 2019 Dergi makalesi Açık Erişim

Yurchenko, Vladimir; Navruz, Tugba; Ciydem, Mehmet; Altintas, Ayhan

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  <identifier identifierType="URL">https://aperta.ulakbim.gov.tr/record/70489</identifier>
  <creators>
    <creator>
      <creatorName>Yurchenko, Vladimir</creatorName>
      <givenName>Vladimir</givenName>
      <familyName>Yurchenko</familyName>
      <affiliation>Gazi Univ, Elect &amp; Elect Engn Dept, Ankara, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Navruz, Tugba</creatorName>
      <givenName>Tugba</givenName>
      <familyName>Navruz</familyName>
      <affiliation>Gazi Univ, Elect &amp; Elect Engn Dept, Ankara, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Ciydem, Mehmet</creatorName>
      <givenName>Mehmet</givenName>
      <familyName>Ciydem</familyName>
      <affiliation>Engitek Engn Technol Ltd, Ankara, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Altintas, Ayhan</creatorName>
      <givenName>Ayhan</givenName>
      <familyName>Altintas</familyName>
      <affiliation>Bilkent Univ, Elect &amp; Elect Engn Dept, Ankara, Turkey</affiliation>
    </creator>
  </creators>
  <titles>
    <title>Microwave Whispering-Gallery-Mode Photoconductivity Measurement Of Recombination Lifetime In Silicon</title>
  </titles>
  <publisher>Aperta</publisher>
  <publicationYear>2019</publicationYear>
  <dates>
    <date dateType="Issued">2019-01-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Journal article</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://aperta.ulakbim.gov.tr/record/70489</alternateIdentifier>
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  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.81043/aperta.70488</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.81043/aperta.70489</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="http://www.opendefinition.org/licenses/cc-by">Creative Commons Attribution</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetimes in high-resistivity semiconductor layers. We applied the method to undoped Si wafers of high resistivity, at 5 and 30 kOhm*cm, and measured conductivity relaxation times of 10 and 14 microseconds, respectively. In the wafers being considered, relaxation times are likely to be defined by the electron-hole diffusion from the bulk to the wafer surface.</description>
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