1 Ocak 2019 Dergi makalesi Açık Erişim

Yurchenko, Vladimir; Navruz, Tugba; Ciydem, Mehmet; Altintas, Ayhan

Citation Style Language JSON

{
  "URL": "https://aperta.ulakbim.gov.tr/record/70489", 
  "abstract": "We present a whispering-gallery-mode resonance-enhanced microwave-detected photoconductivity-decay method for contactless measurement of recombination lifetimes in high-resistivity semiconductor layers. We applied the method to undoped Si wafers of high resistivity, at 5 and 30 kOhm*cm, and measured conductivity relaxation times of 10 and 14 microseconds, respectively. In the wafers being considered, relaxation times are likely to be defined by the electron-hole diffusion from the bulk to the wafer surface.", 
  "author": [
    {
      "family": "Yurchenko", 
      "given": " Vladimir"
    }, 
    {
      "family": "Navruz", 
      "given": " Tugba"
    }, 
    {
      "family": "Ciydem", 
      "given": " Mehmet"
    }, 
    {
      "family": "Altintas", 
      "given": " Ayhan"
    }
  ], 
  "container_title": "ADVANCED ELECTROMAGNETICS", 
  "id": "70489", 
  "issue": "2", 
  "issued": {
    "date-parts": [
      [
        2019, 
        1, 
        1
      ]
    ]
  }, 
  "page": "101-107", 
  "title": "Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon", 
  "type": "article-journal", 
  "volume": "8"
}