1 Ocak 2016 Konferans bildirisi Açık Erişim

Gursoy, Cemil Cem; Yildiz, Abdullah; Goren, Sezer

Citation Style Language JSON

{
  "URL": "https://aperta.ulakbim.gov.tr/record/111812", 
  "abstract": "Multi-cycle scan-based tests allow more faults to be detected by keeping the circuit in functional mode for more than one clock cycle. Optimizing a multi-cycle test set can improve test quality and/or test application time. It is also possible to capture the primary outputs of a circuit multiple times between the scan operations. This ensures that if a fault is detected at the primary outputs, increasing functional clock cycles of the test does not cause loss of detection of that fault. This paper presents a procedure that produces a multi-cycle test set by optimizing a single-cycle test set for fault coverage and test application time while considering stuck-at, bridging and transition faults at the same time.", 
  "author": [
    {
      "family": "Gursoy", 
      "given": " Cemil Cem"
    }, 
    {
      "family": "Yildiz", 
      "given": " Abdullah"
    }, 
    {
      "family": "Goren", 
      "given": " Sezer"
    }
  ], 
  "id": "111812", 
  "issued": {
    "date-parts": [
      [
        2016, 
        1, 
        1
      ]
    ]
  }, 
  "title": "On optimization of multi-cycle tests for test quality and application time", 
  "type": "paper-conference"
}