1 Ocak 2010 Konferans bildirisi Açık Erişim

Vertiy, A. A.; Cetinkaya, H.; Tekbas, M.

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    <subfield code="a">Development of millimeter and sub-millimeter wavelengths technologies is one of the most promising research areas, especially for applications in so called terahertz imaging. In the paper we consider a tomography approach for obtaining 3-D imaging in frequency range from 100 GHz up to 325 GHz. We apply the modernized image reconstruction method, based on developed earlier, for low frequency, surface imaging procedure [1]. We managed to significantly improve the image resolution by newly designed probes for millimeter and sub-millimeter wave range measurements. The images obtained demonstrate that the built measurement system and the image reconstruction method can be used for non-destructive testing applications such as the imaging of manufacturing defect on wafer.</subfield>
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