1 Ocak 2010 Konferans bildirisi Açık Erişim

Vertiy, A. A.; Cetinkaya, H.; Tekbas, M.

Dublin Core

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  <dc:creator>Vertiy, A. A.</dc:creator>
  <dc:creator>Cetinkaya, H.</dc:creator>
  <dc:creator>Tekbas, M.</dc:creator>
  <dc:date>2010-01-01</dc:date>
  <dc:description>Development of millimeter and sub-millimeter wavelengths technologies is one of the most promising research areas, especially for applications in so called terahertz imaging. In the paper we consider a tomography approach for obtaining 3-D imaging in frequency range from 100 GHz up to 325 GHz. We apply the modernized image reconstruction method, based on developed earlier, for low frequency, surface imaging procedure [1]. We managed to significantly improve the image resolution by newly designed probes for millimeter and sub-millimeter wave range measurements. The images obtained demonstrate that the built measurement system and the image reconstruction method can be used for non-destructive testing applications such as the imaging of manufacturing defect on wafer.</dc:description>
  <dc:identifier>https://aperta.ulakbim.gov.trrecord/92791</dc:identifier>
  <dc:identifier>oai:zenodo.org:92791</dc:identifier>
  <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
  <dc:rights>http://www.opendefinition.org/licenses/cc-by</dc:rights>
  <dc:title>Subsurface Sub-terahertz and Terahertz Tomography</dc:title>
  <dc:type>info:eu-repo/semantics/conferencePaper</dc:type>
  <dc:type>publication-conferencepaper</dc:type>
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