1 Ocak 2010 Konferans bildirisi Açık Erişim

Vertiy, A. A.; Cetinkaya, H.; Tekbas, M.

Citation Style Language JSON

{
  "URL": "https://aperta.ulakbim.gov.tr/record/92791", 
  "abstract": "Development of millimeter and sub-millimeter wavelengths technologies is one of the most promising research areas, especially for applications in so called terahertz imaging. In the paper we consider a tomography approach for obtaining 3-D imaging in frequency range from 100 GHz up to 325 GHz. We apply the modernized image reconstruction method, based on developed earlier, for low frequency, surface imaging procedure [1]. We managed to significantly improve the image resolution by newly designed probes for millimeter and sub-millimeter wave range measurements. The images obtained demonstrate that the built measurement system and the image reconstruction method can be used for non-destructive testing applications such as the imaging of manufacturing defect on wafer.", 
  "author": [
    {
      "family": "Vertiy", 
      "given": " A. A."
    }, 
    {
      "family": "Cetinkaya", 
      "given": " H."
    }, 
    {
      "family": "Tekbas", 
      "given": " M."
    }
  ], 
  "id": "92791", 
  "issued": {
    "date-parts": [
      [
        2010, 
        1, 
        1
      ]
    ]
  }, 
  "title": "Subsurface Sub-terahertz and Terahertz Tomography", 
  "type": "paper-conference"
}