1 Ocak 2010 Konferans bildirisi Açık Erişim

Vertiy, A. A.; Cetinkaya, H.; Tekbas, M.

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  <identifier identifierType="URL">https://aperta.ulakbim.gov.tr/record/92791</identifier>
  <creators>
    <creator>
      <creatorName>Vertiy, A. A.</creatorName>
      <givenName>A. A.</givenName>
      <familyName>Vertiy</familyName>
      <affiliation>TUBITAK MRC, Mat Inst, Int Lab High Technol, Gebze, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Cetinkaya, H.</creatorName>
      <givenName>H.</givenName>
      <familyName>Cetinkaya</familyName>
      <affiliation>TUBITAK MRC, Mat Inst, Int Lab High Technol, Gebze, Turkey</affiliation>
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    <creator>
      <creatorName>Tekbas, M.</creatorName>
      <givenName>M.</givenName>
      <familyName>Tekbas</familyName>
      <affiliation>TUBITAK MRC, Mat Inst, Int Lab High Technol, Gebze, Turkey</affiliation>
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  </creators>
  <titles>
    <title>Subsurface Sub-Terahertz And Terahertz Tomography</title>
  </titles>
  <publisher>Aperta</publisher>
  <publicationYear>2010</publicationYear>
  <dates>
    <date dateType="Issued">2010-01-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Conference paper</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://aperta.ulakbim.gov.tr/record/92791</alternateIdentifier>
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    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.81043/aperta.92790</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.81043/aperta.92791</relatedIdentifier>
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    <rights rightsURI="http://www.opendefinition.org/licenses/cc-by">Creative Commons Attribution</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">Development of millimeter and sub-millimeter wavelengths technologies is one of the most promising research areas, especially for applications in so called terahertz imaging. In the paper we consider a tomography approach for obtaining 3-D imaging in frequency range from 100 GHz up to 325 GHz. We apply the modernized image reconstruction method, based on developed earlier, for low frequency, surface imaging procedure [1]. We managed to significantly improve the image resolution by newly designed probes for millimeter and sub-millimeter wave range measurements. The images obtained demonstrate that the built measurement system and the image reconstruction method can be used for non-destructive testing applications such as the imaging of manufacturing defect on wafer.</description>
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