1 Ocak 2017 Konferans bildirisi Açık Erişim

Karaagac, Hakan; Peksu, Elif; Behzad, Hamed; Akgoz, Sare; Parlak, Mehmet

Citation Style Language JSON

{
  "DOI": "10.1002/pssc.201700145", 
  "abstract": "Single phase CuIn0.7Ga0.3Se2 (CIGS) thin films are successfully deposited on glass substrates via a single stage thermal evaporation from a stoichiometric powder of CIGS. X-ray photoelectron spectroscopy measurements reveal the existence of Cu- and Ga-rich surface of the as-grown CIGS thin films. The post-growth annealing process lead to migration of the metallic atoms from the surface region into the bulk during the crystallization process, which subsequently causes a significant reduction in the reflection and a change in the mechanism of conduction. From the photoconductivity measurements it was deduced that the deposited CIGS films demonstrated a drastic decrease in resistivity under different illumination intensities. The post-growth annealing effect on the morphology and structure of CIGS thin films is investigated by means of the atomic force microscopy and X-ray diffraction measurements, respectively. Results show that there is a significant change in surface roughness as well as in degree of crystallinity of the films following the annealing process at different temperatures.", 
  "author": [
    {
      "family": "Karaagac", 
      "given": " Hakan"
    }, 
    {
      "family": "Peksu", 
      "given": " Elif"
    }, 
    {
      "family": "Behzad", 
      "given": " Hamed"
    }, 
    {
      "family": "Akgoz", 
      "given": " Sare"
    }, 
    {
      "family": "Parlak", 
      "given": " Mehmet"
    }
  ], 
  "id": "47949", 
  "issued": {
    "date-parts": [
      [
        2017, 
        1, 
        1
      ]
    ]
  }, 
  "title": "Characterization of CuIn0.7Ga0.3Se2 Thin Films Deposited by Single Stage Thermal Evaporation Process", 
  "type": "paper-conference"
}