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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavas, Hasan


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  <dc:creator>Ketenoglu, Didem</dc:creator>
  <dc:creator>Harder, Manuel</dc:creator>
  <dc:creator>Klementiev, Konstantin</dc:creator>
  <dc:creator>Upton, Mary</dc:creator>
  <dc:creator>Taherkhani, Mehran</dc:creator>
  <dc:creator>Spiwek, Manfred</dc:creator>
  <dc:creator>Dill, Frank-Uwe</dc:creator>
  <dc:creator>Wille, Hans-Christian</dc:creator>
  <dc:creator>Yavas, Hasan</dc:creator>
  <dc:date>2015-01-01</dc:date>
  <dc:description>An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.</dc:description>
  <dc:identifier>https://aperta.ulakbim.gov.trrecord/77773</dc:identifier>
  <dc:identifier>oai:zenodo.org:77773</dc:identifier>
  <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
  <dc:rights>http://www.opendefinition.org/licenses/cc-by</dc:rights>
  <dc:source>JOURNAL OF SYNCHROTRON RADIATION 22 961-967</dc:source>
  <dc:title>Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge</dc:title>
  <dc:type>info:eu-repo/semantics/article</dc:type>
  <dc:type>publication-article</dc:type>
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