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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavas, Hasan


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{
  "@context": "https://schema.org/", 
  "@id": 77773, 
  "@type": "ScholarlyArticle", 
  "creator": [
    {
      "@type": "Person", 
      "name": "Ketenoglu, Didem"
    }, 
    {
      "@type": "Person", 
      "name": "Harder, Manuel"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Lund Univ, MAX Lab 4, SE-22100 Lund, Sweden", 
      "name": "Klementiev, Konstantin"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Argonne Natl Lab, Argonne, IL 60439 USA", 
      "name": "Upton, Mary"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany", 
      "name": "Taherkhani, Mehran"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany", 
      "name": "Spiwek, Manfred"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany", 
      "name": "Dill, Frank-Uwe"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany", 
      "name": "Wille, Hans-Christian"
    }, 
    {
      "@type": "Person", 
      "affiliation": "Deutsch Elektronen Synchrotron DESY, D-22607 Hamburg, Germany", 
      "name": "Yavas, Hasan"
    }
  ], 
  "datePublished": "2015-01-01", 
  "description": "An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.", 
  "headline": "Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge", 
  "identifier": 77773, 
  "image": "https://aperta.ulakbim.gov.tr/static/img/logo/aperta_logo_with_icon.svg", 
  "license": "http://www.opendefinition.org/licenses/cc-by", 
  "name": "Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge", 
  "url": "https://aperta.ulakbim.gov.tr/record/77773"
}
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