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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

2015    Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavas, Hasan

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.