1 Ocak 2023 Dergi makalesi Açık Erişim

Ireland, J.; Reuvekamp, P. G.; Williams, J. M.; Peral, D.; Diaz de Aguilar, J.; Sanmamed, Y. A.; Sira, M.; Maslan, S.; Rzodkiewicz, W.; Bruszewski, P.; Sadkowski, G.; Sosso, A.; Cabral, V; Malmbekk, H.; Pokatilov, A.; Herick, J.; Behr, R.; Ozturk, T. Coskun; Arifovic, M.; Ilic, D.

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    <subfield code="a">&lt;p&gt;A method for traceability to SI for ac voltage and current based on high performance digitizers is presented. In contrast to the existing thermal-based methods, the proposed method utilizes direct traceability to quantum-based waveforms via the use of Josephson voltage systems. This allows not only a simplification of the traceability chain and reduced measurement times but also offers the potential for analysis of the ac voltage and current waveform spectral content, a feature which is not possible using thermal methods. Scaling of current and voltage is achieved by the use of current shunts and resistive voltage dividers respectively. Target operating ranges are up to 1 A and 100 V with a frequency range up to 1 kHz for both. The corresponding target uncertainty for this traceability route is 1 mu V V-1 and 2 mu A A(-1) up to frequencies of 1 kHz. The traceability chain is described and various components are characterized to validate their suitability for this task. It is demonstrated that these uncertainty targets can be met under certain conditions. The use of multi-tone calibration waveforms is investigated to further reduce measurement time. An uncertainty analysis method based on simulation using real component performance data is demonstrated.&lt;/p&gt;</subfield>
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