1 Ocak 2023 Dergi makalesi Açık Erişim

Ireland, J.; Reuvekamp, P. G.; Williams, J. M.; Peral, D.; Diaz de Aguilar, J.; Sanmamed, Y. A.; Sira, M.; Maslan, S.; Rzodkiewicz, W.; Bruszewski, P.; Sadkowski, G.; Sosso, A.; Cabral, V; Malmbekk, H.; Pokatilov, A.; Herick, J.; Behr, R.; Ozturk, T. Coskun; Arifovic, M.; Ilic, D.

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        "affiliation": "Natl Phys Lab, Hampton Rd, Teddington TW11 0LW, Middx, England", 
        "name": "Ireland, J."
      }, 
      {
        "affiliation": "Natl Phys Lab, Hampton Rd, Teddington TW11 0LW, Middx, England", 
        "name": "Reuvekamp, P. G."
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      {
        "affiliation": "Natl Phys Lab, Hampton Rd, Teddington TW11 0LW, Middx, England", 
        "name": "Williams, J. M."
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      {
        "affiliation": "Spanish Ctr Metrol, CEM, del Alfar 2, Madrid 28760, Spain", 
        "name": "Peral, D."
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      {
        "affiliation": "Spanish Ctr Metrol, CEM, del Alfar 2, Madrid 28760, Spain", 
        "name": "Diaz de Aguilar, J."
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        "affiliation": "Spanish Ctr Metrol, CEM, del Alfar 2, Madrid 28760, Spain", 
        "name": "Sanmamed, Y. A."
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      {
        "affiliation": "Czech Metrol Inst, Okruzni 31, Brno 63600, Czech Republic", 
        "name": "Sira, M."
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      {
        "affiliation": "Czech Metrol Inst, Okruzni 31, Brno 63600, Czech Republic", 
        "name": "Maslan, S."
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      {
        "affiliation": "Cent Off Measures, GUM, Elektoralna 2, PL-00139 Warsaw, Poland", 
        "name": "Rzodkiewicz, W."
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      {
        "affiliation": "Cent Off Measures, GUM, Elektoralna 2, PL-00139 Warsaw, Poland", 
        "name": "Bruszewski, P."
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      {
        "affiliation": "Cent Off Measures, GUM, Elektoralna 2, PL-00139 Warsaw, Poland", 
        "name": "Sadkowski, G."
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        "affiliation": "INRiM, Str Cacce 91, I-10135 Turin, Italy", 
        "name": "Sosso, A."
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        "affiliation": "Inst Portugues Qualidade IPQ, Rua Antonio Giao 2, P-2829513 Caparica, Portugal", 
        "name": "Cabral, V"
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      {
        "affiliation": "Justervesenet, Fetveien 99, N-2007 Kjeller, Norway", 
        "name": "Malmbekk, H."
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      {
        "affiliation": "AS Metrosert, EE-12618 Tallinn, Estonia", 
        "name": "Pokatilov, A."
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      {
        "affiliation": "Phys Tech Bundesanstalt PTB, Bundesallee 100, D-38116 Braunschweig, Germany", 
        "name": "Herick, J."
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      {
        "affiliation": "Phys Tech Bundesanstalt PTB, Bundesallee 100, D-38116 Braunschweig, Germany", 
        "name": "Behr, R."
      }, 
      {
        "affiliation": "TUBITAK Ulusal Metrol Enstitusu UME, PK 54, TR-41470 Gebze, Turkiye", 
        "name": "Ozturk, T. Coskun"
      }, 
      {
        "affiliation": "TUBITAK Ulusal Metrol Enstitusu UME, PK 54, TR-41470 Gebze, Turkiye", 
        "name": "Arifovic, M."
      }, 
      {
        "affiliation": "Primary Electromagnet Lab FER PEL, Fac Elect Engn & Comp, Unska 3, HR-10000 Zagreb, Croatia", 
        "name": "Ilic, D."
      }
    ], 
    "description": "<p>A method for traceability to SI for ac voltage and current based on high performance digitizers is presented. In contrast to the existing thermal-based methods, the proposed method utilizes direct traceability to quantum-based waveforms via the use of Josephson voltage systems. This allows not only a simplification of the traceability chain and reduced measurement times but also offers the potential for analysis of the ac voltage and current waveform spectral content, a feature which is not possible using thermal methods. Scaling of current and voltage is achieved by the use of current shunts and resistive voltage dividers respectively. Target operating ranges are up to 1 A and 100 V with a frequency range up to 1 kHz for both. The corresponding target uncertainty for this traceability route is 1 mu V V-1 and 2 mu A A(-1) up to frequencies of 1 kHz. The traceability chain is described and various components are characterized to validate their suitability for this task. It is demonstrated that these uncertainty targets can be met under certain conditions. The use of multi-tone calibration waveforms is investigated to further reduce measurement time. An uncertainty analysis method based on simulation using real component performance data is demonstrated.</p>", 
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      "pages": "17", 
      "title": "MEASUREMENT SCIENCE AND TECHNOLOGY", 
      "volume": "34"
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    "publication_date": "2023-01-01", 
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    "title": "A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI"
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