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Ireland, J.; Reuvekamp, P. G.; Williams, J. M.; Peral, D.; Diaz de Aguilar, J.; Sanmamed, Y. A.; Sira, M.; Maslan, S.; Rzodkiewicz, W.; Bruszewski, P.; Sadkowski, G.; Sosso, A.; Cabral, V; Malmbekk, H.; Pokatilov, A.; Herick, J.; Behr, R.; Ozturk, T. Coskun; Arifovic, M.; Ilic, D.
@article{ireland_j_2023_265234, author = {Ireland, J. and Reuvekamp, P. G. and Williams, J. M. and Peral, D. and Diaz de Aguilar, J. and Sanmamed, Y. A. and Sira, M. and Maslan, S. and Rzodkiewicz, W. and Bruszewski, P. and Sadkowski, G. and Sosso, A. and Cabral, V and Malmbekk, H. and Pokatilov, A. and Herick, J. and Behr, R. and Ozturk, T. Coskun and Arifovic, M. and Ilic, D.}, title = {{A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI}}, journal = {MEASUREMENT SCIENCE AND TECHNOLOGY}, year = 2023, volume = 34, number = 1, pages = 17, month = jan, }
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