1 Ocak 2012 Konferans bildirisi Açık Erişim

Nasibov, Humbat; Mamedbeili, Izmir; Riza, Dadash; Balaban, Ertan; Hacizade, Fikret

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{
  "@context": "https://schema.org/", 
  "@id": 104797, 
  "@type": "ScholarlyArticle", 
  "creator": [
    {
      "@type": "Person", 
      "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
      "name": "Nasibov, Humbat"
    }, 
    {
      "@type": "Person", 
      "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
      "name": "Mamedbeili, Izmir"
    }, 
    {
      "@type": "Person", 
      "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
      "name": "Riza, Dadash"
    }, 
    {
      "@type": "Person", 
      "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
      "name": "Balaban, Ertan"
    }, 
    {
      "@type": "Person", 
      "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
      "name": "Hacizade, Fikret"
    }
  ], 
  "datePublished": "2012-01-01", 
  "description": "Progresses in the optical coatings and optical material fields require an increase in the sensitivity and accuracy of the optical parameters' measurement methods and systems. In this work we describe a flexible and high-accuracy system for measuring the main optical characteristics at 632.8 nm wavelength. The system comprises two methods: a laser ratiometric measurement method for absolute measurement of the transmittance and the specular reflectance, and an integrating-sphere method for assessment of the total integrated scattering. The system utilizes an intensity stabilized He-Ne laser as a light source. Two four-element trap detectors are used: the first for monitoring of laser power, the second (fixed on a motorized stage) for the measurement of reflectance and transmittance, one after another. A PMT mounted to the exit port of a 40 cm diameter integrating hemisphere, is used for measuring the total integrated scattering. A series of measurements with several reference mirrors showed that the system is able to measure the specular reflectance with a reproducibility of <0.005%, transmittance of 0.005% with a reproducibility <0.005%, and total integrated scattering about 10 ppm, with a reproducibility of <5 ppm at 2 sigma. The system allows characterizing of optical components with diameters between 5 mm and 50 mm.", 
  "headline": "High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm", 
  "identifier": 104797, 
  "image": "https://aperta.ulakbim.gov.tr/static/img/logo/aperta_logo_with_icon.svg", 
  "license": "http://www.opendefinition.org/licenses/cc-by", 
  "name": "High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm", 
  "url": "https://aperta.ulakbim.gov.tr/record/104797"
}