1 Ocak 2012 Konferans bildirisi Açık Erişim

Nasibov, Humbat; Mamedbeili, Izmir; Riza, Dadash; Balaban, Ertan; Hacizade, Fikret

Citation Style Language JSON

{
  "DOI": "10.1117/12.921651", 
  "abstract": "Progresses in the optical coatings and optical material fields require an increase in the sensitivity and accuracy of the optical parameters' measurement methods and systems. In this work we describe a flexible and high-accuracy system for measuring the main optical characteristics at 632.8 nm wavelength. The system comprises two methods: a laser ratiometric measurement method for absolute measurement of the transmittance and the specular reflectance, and an integrating-sphere method for assessment of the total integrated scattering. The system utilizes an intensity stabilized He-Ne laser as a light source. Two four-element trap detectors are used: the first for monitoring of laser power, the second (fixed on a motorized stage) for the measurement of reflectance and transmittance, one after another. A PMT mounted to the exit port of a 40 cm diameter integrating hemisphere, is used for measuring the total integrated scattering. A series of measurements with several reference mirrors showed that the system is able to measure the specular reflectance with a reproducibility of <0.005%, transmittance of 0.005% with a reproducibility <0.005%, and total integrated scattering about 10 ppm, with a reproducibility of <5 ppm at 2 sigma. The system allows characterizing of optical components with diameters between 5 mm and 50 mm.", 
  "author": [
    {
      "family": "Nasibov", 
      "given": " Humbat"
    }, 
    {
      "family": "Mamedbeili", 
      "given": " Izmir"
    }, 
    {
      "family": "Riza", 
      "given": " Dadash"
    }, 
    {
      "family": "Balaban", 
      "given": " Ertan"
    }, 
    {
      "family": "Hacizade", 
      "given": " Fikret"
    }
  ], 
  "id": "104797", 
  "issued": {
    "date-parts": [
      [
        2012, 
        1, 
        1
      ]
    ]
  }, 
  "title": "High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm", 
  "type": "paper-conference"
}