1 Ocak 2012 Konferans bildirisi Açık Erişim

Nasibov, Humbat; Mamedbeili, Izmir; Riza, Dadash; Balaban, Ertan; Hacizade, Fikret

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        "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
        "name": "Nasibov, Humbat"
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      {
        "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
        "name": "Mamedbeili, Izmir"
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      {
        "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
        "name": "Riza, Dadash"
      }, 
      {
        "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
        "name": "Balaban, Ertan"
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      {
        "affiliation": "TUBITAK BILGEM, Sci & Tech Res Council Turkey, Optoelect Dept, TR-41470 Gebze, Kocaeli, Turkey", 
        "name": "Hacizade, Fikret"
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    "description": "Progresses in the optical coatings and optical material fields require an increase in the sensitivity and accuracy of the optical parameters' measurement methods and systems. In this work we describe a flexible and high-accuracy system for measuring the main optical characteristics at 632.8 nm wavelength. The system comprises two methods: a laser ratiometric measurement method for absolute measurement of the transmittance and the specular reflectance, and an integrating-sphere method for assessment of the total integrated scattering. The system utilizes an intensity stabilized He-Ne laser as a light source. Two four-element trap detectors are used: the first for monitoring of laser power, the second (fixed on a motorized stage) for the measurement of reflectance and transmittance, one after another. A PMT mounted to the exit port of a 40 cm diameter integrating hemisphere, is used for measuring the total integrated scattering. A series of measurements with several reference mirrors showed that the system is able to measure the specular reflectance with a reproducibility of <0.005%, transmittance of 0.005% with a reproducibility <0.005%, and total integrated scattering about 10 ppm, with a reproducibility of <5 ppm at 2 sigma. The system allows characterizing of optical components with diameters between 5 mm and 50 mm.", 
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      "title": "LASER SOURCES AND APPLICATIONS"
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    "title": "High-precision measurements of reflectance, transmittance, and scattering at 632.8 nm"
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