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Bychkova, O.; Parygin, P.; Garutti, E.; Kaminsky, A.; Martens, S.; Popova, E.; Schwandt, J.; Stifutkin, A.
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"> <dc:creator>Bychkova, O.</dc:creator> <dc:creator>Parygin, P.</dc:creator> <dc:creator>Garutti, E.</dc:creator> <dc:creator>Kaminsky, A.</dc:creator> <dc:creator>Martens, S.</dc:creator> <dc:creator>Popova, E.</dc:creator> <dc:creator>Schwandt, J.</dc:creator> <dc:creator>Stifutkin, A.</dc:creator> <dc:date>2022-01-01</dc:date> <dc:description>A dedicated single-cell SiPM structure is designed and measured to investigate the radiation damage effects on the gain and turn-off voltage of SiPMs exposed to a reactor neutron fluence up to Phi = 5e13 cm(-2). The cell has a pitch of 15 mu m. The fluence dependence of gain and turn-off voltage are reported. A reduction of the gain by 19% and an increase of v(off)by asymptotic to 0.5 V is observed after Phi = 5e13 cm(-2).</dc:description> <dc:identifier>https://aperta.ulakbim.gov.trrecord/256397</dc:identifier> <dc:identifier>oai:aperta.ulakbim.gov.tr:256397</dc:identifier> <dc:rights>info:eu-repo/semantics/openAccess</dc:rights> <dc:rights>http://www.opendefinition.org/licenses/cc-by</dc:rights> <dc:source>NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 1031</dc:source> <dc:title>Radiation hardness study using SiPMs with single-cell readout</dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> <dc:type>publication-article</dc:type> </oai_dc:dc>
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