1 Ocak 2001 Dergi makalesi Açık Erişim

Birlikseven, C; Altintas, E; Durusoy, HZ

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  <identifier identifierType="URL">https://aperta.ulakbim.gov.tr/record/94567</identifier>
  <creators>
    <creator>
      <creatorName>Birlikseven, C</creatorName>
      <givenName>C</givenName>
      <familyName>Birlikseven</familyName>
    </creator>
    <creator>
      <creatorName>Altintas, E</creatorName>
      <givenName>E</givenName>
      <familyName>Altintas</familyName>
    </creator>
    <creator>
      <creatorName>Durusoy, HZ</creatorName>
      <givenName>HZ</givenName>
      <familyName>Durusoy</familyName>
    </creator>
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  <titles>
    <title>A Low-Temperature Pyroelectric Study Of Pvdf Thick Films</title>
  </titles>
  <publisher>Aperta</publisher>
  <publicationYear>2001</publicationYear>
  <dates>
    <date dateType="Issued">2001-01-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Journal article</resourceType>
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    <alternateIdentifier alternateIdentifierType="url">https://aperta.ulakbim.gov.tr/record/94567</alternateIdentifier>
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    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.81043/aperta.94566</relatedIdentifier>
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  <rightsList>
    <rights rightsURI="http://www.opendefinition.org/licenses/cc-by">Creative Commons Attribution</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
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  <descriptions>
    <description descriptionType="Abstract">Pyroelectric coefficient measurements were made at various temperatures for poled and unpoled samples of PVDF films. Samples were produced using the spin-coating technique onto glass substrates. Experiments were made using the quasi-static technique. PVDF samples were poled at various electric field strengths and the relation between poling field strength and the pyroelectric coefficient was investigated. The effect of the poling temperature was also studied. The maximum pyroelectric coefficient was obtained for a poling temperature of 340 K and for a poling field strength of 14MVm(-1). Dielectric permitivity and dielectric loss measurements were also performed in the 125-375 K temperature range. (C) 2001 Kluwer Academic Publishers.</description>
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