1 Ocak 2018 Konferans bildirisi Açık Erişim

Kaya, Z. E.; Tekin, S. B.; Kalem, S.

DataCite XML

<?xml version='1.0' encoding='utf-8'?>
<resource xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://datacite.org/schema/kernel-4" xsi:schemaLocation="http://datacite.org/schema/kernel-4 http://schema.datacite.org/meta/kernel-4.1/metadata.xsd">
  <identifier identifierType="URL">https://aperta.ulakbim.gov.tr/record/92999</identifier>
  <creators>
    <creator>
      <creatorName>Kaya, Z. E.</creatorName>
      <givenName>Z. E.</givenName>
      <familyName>Kaya</familyName>
      <affiliation>TUBITAK BILGEM, Informat &amp; Informat Secur Res Ctr, Kocaeli, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Tekin, S. B.</creatorName>
      <givenName>S. B.</givenName>
      <familyName>Tekin</familyName>
      <affiliation>TUBITAK BILGEM, Informat &amp; Informat Secur Res Ctr, Kocaeli, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Kalem, S.</creatorName>
      <givenName>S.</givenName>
      <familyName>Kalem</familyName>
      <affiliation>TUBITAK BILGEM, Informat &amp; Informat Secur Res Ctr, Kocaeli, Turkey</affiliation>
    </creator>
  </creators>
  <titles>
    <title>Design Of An Fpga-Based Rram Parameter Measurement Platform</title>
  </titles>
  <publisher>Aperta</publisher>
  <publicationYear>2018</publicationYear>
  <dates>
    <date dateType="Issued">2018-01-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Conference paper</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://aperta.ulakbim.gov.tr/record/92999</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.81043/aperta.92998</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.81043/aperta.92999</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="http://www.opendefinition.org/licenses/cc-by">Creative Commons Attribution</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">Flash memory has been the dominant technology in non-volatile memory market for the last couple of decades. Along with down-scaling in the CMOS manufacturing process, industry and academia started to evaluate the use of alternative memory cell architectures so that the integration problems and the performance degradation seen in Flash memories can be overcome. Resistive Random-Access Memory (RRAM) technology has emerged as a promising option for manufacturing larger memory arrays in a smaller area and with higher performance. There are multiple types of RRAM memory cell architectures. HfO2-based memory cells are a type of oxide based RRAM memory cell architectures which rely on the resistance change of a dielectric material. In this work, an FPGA-based test platform which is designed to test 4Kbit RRAM samples is presented. The proposed system differs from other RRAM measurement platforms by its simplicity and the independency from a more sophisticated carrier module. The platform also allows development of security primitives which can benefit from the intrinsic characteristics of HfO2-based RRAM arrays.</description>
  </descriptions>
</resource>