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Ozkan, T.; Gulmez, G.; Gulmez, Y.; Turhan, E.; Tesneli, N. B.
<?xml version='1.0' encoding='utf-8'?> <oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd"> <dc:creator>Ozkan, T.</dc:creator> <dc:creator>Gulmez, G.</dc:creator> <dc:creator>Gulmez, Y.</dc:creator> <dc:creator>Turhan, E.</dc:creator> <dc:creator>Tesneli, N. B.</dc:creator> <dc:date>2013-01-01</dc:date> <dc:description>The Impedance Group Laboratories of National Metrology Institute of Turkey previously developed a new method for the characterization of Agilent 16380A-type four-terminal-pair air dielectric capacitance standards ranged from 1 to 1,000 pF up to 30 MHz. This method is based on obtaining all resonance frequencies of standard capacitors using a vector network analyzer in order to calculate inductive residual parameters of the standards. As a continuation of the study, this paper gives a detailed uncertainty analysis for the method.</dc:description> <dc:identifier>https://aperta.ulakbim.gov.trrecord/91935</dc:identifier> <dc:identifier>oai:zenodo.org:91935</dc:identifier> <dc:rights>info:eu-repo/semantics/openAccess</dc:rights> <dc:rights>http://www.opendefinition.org/licenses/cc-by</dc:rights> <dc:source>MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA 28(2) 85-90</dc:source> <dc:title>Uncertainty Analysis of Four-Terminal-Pair Capacitance Characterization up 30 MHz</dc:title> <dc:type>info:eu-repo/semantics/article</dc:type> <dc:type>publication-article</dc:type> </oai_dc:dc>
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