1 Ocak 2012 Dergi makalesi Açık Erişim

Aydin, H.; Mansour, Sh. A.; Aydin, C.; Al-Ghamdi, Ahmed A.; Al-Hartomy, Omar A.; El-Tantawy, Farid; Yakuphanoglu, F.

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  <identifier identifierType="URL">https://aperta.ulakbim.gov.tr/record/88855</identifier>
  <creators>
    <creator>
      <creatorName>Aydin, H.</creatorName>
      <givenName>H.</givenName>
      <familyName>Aydin</familyName>
      <affiliation>Firat Univ, Dept Phys, Fac Sci, TR-23169 Elazig, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Mansour, Sh. A.</creatorName>
      <givenName>Sh. A.</givenName>
      <familyName>Mansour</familyName>
    </creator>
    <creator>
      <creatorName>Aydin, C.</creatorName>
      <givenName>C.</givenName>
      <familyName>Aydin</familyName>
      <affiliation>Firat Univ, Fac Technol, Met &amp; Mat Engn Dept, TR-23169 Elazig, Turkey</affiliation>
    </creator>
    <creator>
      <creatorName>Al-Ghamdi, Ahmed A.</creatorName>
      <givenName>Ahmed A.</givenName>
      <familyName>Al-Ghamdi</familyName>
      <affiliation>King Abdulaziz Univ, Fac Sci, Dept Phys, Jeddah 21589, Saudi Arabia</affiliation>
    </creator>
    <creator>
      <creatorName>Al-Hartomy, Omar A.</creatorName>
      <givenName>Omar A.</givenName>
      <familyName>Al-Hartomy</familyName>
    </creator>
    <creator>
      <creatorName>El-Tantawy, Farid</creatorName>
      <givenName>Farid</givenName>
      <familyName>El-Tantawy</familyName>
      <affiliation>Suez Canal Univ, Fac Sci, Dept Phys, Ismailia, Egypt</affiliation>
    </creator>
    <creator>
      <creatorName>Yakuphanoglu, F.</creatorName>
      <givenName>F.</givenName>
      <familyName>Yakuphanoglu</familyName>
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  </creators>
  <titles>
    <title>Optical Properties Of Nanostructure Boron Doped Nio Thin Films</title>
  </titles>
  <publisher>Aperta</publisher>
  <publicationYear>2012</publicationYear>
  <dates>
    <date dateType="Issued">2012-01-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Journal article</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://aperta.ulakbim.gov.tr/record/88855</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.1007/s10971-012-2909-1</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="http://www.opendefinition.org/licenses/cc-by">Creative Commons Attribution</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">Boron doped NiO films were prepared by sol-gel method. The effects of B content on the morphological and optical properties of NiO films were studied with atomic force microscopy, and optical characterization method. The average transmittance at the visible region is reached to 75 % for lower doped films (0.1 and 0.2 % B), whereas, the recorded average value of transmittance was about 62 % for doped film with 1 % B throughout the region. The optical energy gap value for pure NiO film was found to be 3.73 eV. These values were affected by B doping with non-monotonic variation and reached to 3.64 eV for 0.1 % B doped NiO. Also, the refractive index dispersion and dielectric constants of the NiO films were studied throughout the investigated range of wavelengths. The obtained results indicate that the optical parameters of the NiO film are controlled with boron doping.</description>
  </descriptions>
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