1 Ocak 2021 Dergi makalesi Açık Erişim

Morkoc, Berk; Kahraman, Aysegul; Yilmaz, Ercan

BibTeX

@article{morkoc_berk_2021_236198,
  author       = {Morkoc, Berk and
                  Kahraman, Aysegul and
                  Yilmaz, Ercan},
  title        = {{Effects of the oxide/interface traps on the 
                   electrical characteristics in
                   Al/Yb2O3/SiO2/n-Si/Al MOS capacitors}},
  journal      = {{JOURNAL OF MATERIALS SCIENCE-MATERIALS IN 
                   ELECTRONICS}},
  year         = 2021,
  volume       = 32,
  number       = 7,
  pages        = {9231-9243},
  month        = jan,
}