Published January 1, 2009 | Version v1
Journal article Open

Magnetic and magneto-optical studies on Zn1-xCrxTe (x=0.05) films grown on glass substrate

  • 1. Bharathiar Univ, Dept Phys, Thin Films & Nanomat Lab, Coimbatore 641046, Tamil Nadu, India
  • 2. Bharathiar Univ, Dept Nanosci & Technol, Coimbatore 641046, Tamil Nadu, India
  • 3. UME, TUBITAK, Natl Inst Metrol, TR-41470 Gebze, Turkey
  • 4. Univ Queensland, Sch Mol Microbial Sci, St Lucia, Qld 4072, Australia

Description

Zn1-xCrxTe (x=0.05) films were prepared by thermal evaporation onto glass substrates. X-ray diffraction (XRD) was used to determine the crystalline quality of the ZnTe:Cr film. Magnetic force microscopy (MFM) investigation has shown a non-uniform distribution of magnetic domains with an average size of 4 nm at room temperature. SQUID measurements have further shown that the non-uniform distribution of domains does not affect the room temperature ferromagnetism of this material. Electron spin resonance spectroscopy (ESR) was done to determine the Cr valence state in the ZnTe lattice. Magnetic circular dichroism (MCD) analysis was used to confirm the ZnCrTe phase contributing to the ferromagnetic behavior. (C) 2009 Elsevier B.V. All rights reserved.

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