Image multi-thresholding based on sample moment function

A new multi-level thresholding method is proposed using Sample Moment Function (SMF). For the binary case the method can make use of the a priori information on whether the target object is found on the darker or lighter part of the scene. Extensive comparisons using a database of NDT images show that the proposed method outperforms in competition 40 other thresholding methods from the literature [1][2], based upon both objective scores and subjective evaluation.