Ferromagnetism in ZnTe:Cr film grown on Si(100)

Zn(1-x)Cr(x)Te (x = 0.0 and 0.05) films were grown on Si(1 0 0) substrate by using thermal evaporation method. The structure of the films was investigated by X-ray diffraction and it showed the formation of ZnCrTe phase with an amorphous background, which indicated poor crystallinity. Composition analysis by XPS disclosed the presence of antiferromagnetic Cr(2)O(3) and Cr precipitates. Magnetic domains were observed by using magnetic force microscopy at ambient temperature and the result showed anisotropic domains with an average size of 3.5 nm. Magnetic field dependence of magnetic moment measurements showed obvious hysteresis loop with a coercive field of 121 Oe at 300 K. Temperature dependence of magnetic moment showed short-range ferromagnetic order. The Curie temperature was estimated to be 354.5 K. (C) 2010 Elsevier B.V. All rights reserved.