Yayınlanmış 1 Ocak 2020
| Sürüm v1
Dergi makalesi
Açık
Optical and electrical characterization of thin film MSP heterojunction based on organic material Al/p-Si/P3HT/Ag
- 1. Suleyman Demirel Univ, Innovat Technol Applicat & Res Ctr, Dept Phys, Energy Technol Res Unit Lab, TR-32260 Isparta, Turkey
- 2. Suleyman Demirel Univ, Grad Sch Nat & Appl Sci, TR-32260 Isparta, Turkey
Açıklama
Fabrication and characterization of metal/semiconductor/polymer/metal (MSP) heterojunction diode are reported. The Al/p-Si/P3HT/Ag MSP heterojunction have been manufactured by a homemade ultrasonic spray pyrolysis (USP) method, and the organic layer has a thickness of similar to 150 nm and silver as front contact is deposited by physical vapor deposition (PVD) technique. The organic layer is deposited on glass and has been subject of XRD diffraction, patterns which revealed a grain size of similar to 18 nm, UV-Vis measurement and scanning electron microscope (SEM) images characterization.
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Dosyalar
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