Published January 1, 2014
| Version v1
Journal article
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SiC Substrate Effects on Electron Transport in the Epitaxial Graphene Layer
Creators
- 1. Bilkent Univ, Dept Elect & Elect Engn, Dept Phys, Nanotechnol Res Ctr, TR-06800 Ankara, Turkey
- 2. Gazi Univ, Fac Sci, Dept Phys, Ankara, Turkey
- 3. Bilkent Univ, Dept Chem, TR-06800 Bilkent, Turkey
- 4. Anadolu Univ, Fac Sci, Dept Phys, TR-26470 Eskisehir, Turkey
- 5. Linkoping Univ Technol, Dept Phys Chem & Biol, Linkoping, Sweden
Description
Hall effect measurements on epitaxial graphene (EG) on SiC substrate have been carried out as a function of temperature. The mobility and concentration of electrons within the two-dimensional electron gas (2DEG) at the EG layers and within the underlying SiC substrate are readily separated and characterized by the simple parallel conduction extraction method (SPCEM). Two electron carriers are identified in the EG/SiC sample: one high-mobility carrier (3493 cm(2)/Vs at 300 K) and one low-mobility carrier (1115 cm(2)/Vs at 300 K). The high mobility carrier can be assigned to the graphene layers. The second carrier has been assigned to the SiC substrate.
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