Measurement of L-3 subshell absorption jump ratios and jump factors for high Z elements using EDXRF technique

Energy dispersive X-ray fluorescence technique (EDXRF) has been employed for measuring L-3-subshell absorption jump ratios, r(L3) and jump factors, J(L3) for high Z elements. Jump factors and jump ratios for these elements have been determined by measuring L-3 subshell fluorescence parameters such as L-3 subshell X-ray production cross section sigma(L3), L-3 subshell fluorescence yield, omega(L3) total L-3 subshell and higher subshells photoionization cross section sigma(T)(L) Measurements were performed using a Cd-109 radioactive point source and an Si(Li) detector in direct excitation experimental geometry. Measured values for jump factors and jump ratios have been compared with theoretically calculated and other experimental values. (C) 2014 Elsevier Ltd. All rights reserved.