Published January 1, 2017 | Version v1
Journal article Open

Phase-ambiguity-free and accurate permittivity determination from waveguide measurements

  • 1. Gaziantep Univ, Dept Elect & Elect Engn, TR-27310 Gaziantep, Turkey
  • 2. Munzur Univ, Dept Elect & Elect Engn, TR-62000 Tunceli, Turkey

Description

A microwave method has been proposed for accurate and unique extraction of relative complex permittivity (epsilon(r)) of dielectric materials from 2 pi phase-ambiguity-free amplitude-only two-port and one-port scattering parameter measurements. Improved accuracy has been shown by the applied uncertainty analysis. For the validation of our method, epsilon(r) of low-loss and lossy samples was extracted. Published by AIP Publishing.

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