Phase-ambiguity-free and accurate permittivity determination from waveguide measurements

A microwave method has been proposed for accurate and unique extraction of relative complex permittivity (epsilon(r)) of dielectric materials from 2 pi phase-ambiguity-free amplitude-only two-port and one-port scattering parameter measurements. Improved accuracy has been shown by the applied uncertainty analysis. For the validation of our method, epsilon(r) of low-loss and lossy samples was extracted. Published by AIP Publishing.