A POSITION-INVARIANT CALIBRATION-INDEPENDENT METHOD FOR PERMITTIVITY MEASUREMENTS

A simple yet powerful calibration-independent method is proposed for complex permittivity extraction of dielectric materials. There are two main features of the method as,as follows: (a) it decreases and uncertainty arising from using a second (extra) sample and (b) it does not require precise location of the sample within its cell (a waveguide or coaxial-line section). The disadvantage of the method is that it may produce some singularity points while extracting the complex permittivity from measurements. We validated the method by calibrated and uncalibrated complex scattering parameter measurements of a poly-vinl-chloride (PVC) sample at X-band (8.2-12.4 GHz). (c) 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1406-1408, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24364