A comprehensive analysis of the effect of BaO incorporation on Gamma-Ray attenuation characteristics in SiO₂-B₂O₃-SrO-ZrO₂ glass systems

This work presents an analysis of the effect of BaO incorporation on the gamma-ray attenuation properties of systematically evaluated SiO2-B2O3-SrO-ZrO2 glass matrices. Radiation shielding parameters determined using XCOM and EGS4 calculation codes were compared. There was an increase in glass density from 5.84 g/cm(3) to 6.32 g/cm(3) when the BaO content rose from roughly 10% to 40%. Using sophisticated WinXCom and EGS-4 calculations, the mass attenuation values (mu/rho) of BaO doped SiO2-B2O3-SrO-ZrO2 glass systems (abbreviated BaSiBSZ) were found. This study systematically and thoroughly evaluated the effect of BaO integration on the radiation shielding capabilities of the glass system over a wide range of gamma-ray photon energies, specifically between 59.5 keV and 1332 keV. Initially, HVL (half-value layer) and MFP (mean free path) values were derived from the calculated mass attenuation coefficients. The evaluation of several crucial shielding parameters, including RPE, Z(eff), SR, and k(gamma), came next. The steady reduction of SrO oxide concentration and substitution of BaO in BaSiSBZ glass systems resulted in notable modifications in radiation protection properties. The BaSiBSZ glass systems showed a similar decrease in both HVL and MFP at a constant energy level as the BaO doping concentration was progressively raised. Concurrently, a notable enhancement was noted in RPE, Z(eff), SR, and k(gamma) coefficients. The results demonstrate that higher BaO concentrations greatly enhance the material's radiation-shielding capabilities, enhancing both photon and neutron attenuation and bolstering the overall performance of the glass system.