Characterization of Buffer Layers on Ni-based Substrates for YBCO Superconductors

Metal oxide buffer layers provide a Continuous, smooth textured and chemically inert surface for growth of the YBCO (YBa(2)Cu(3)O(7-x) film and prevent metal diffusion from the substrate into the superconductor. CeO(2), Gd(2)O(3) and Eu(2)O(3) buffer layers were grown oil metallic Ni Substrates Using a sol-gel method by using metal 2,4-pentaned ion ate and acetate precursors. The films were annealed at 1150 degrees C under 4%H(2)Ar gas nliXtLIre. Textured, crack free and continuous buffer layers were obtained through the sol-gel technique. Prior to the coating process, Solution characterization was performed by turbidimeter, pH meter, contact angle goniometer and rheometer. Heat treatment profiles were determined by using DTA-TG and FTIR. The coated layers were characterized by means of XRD, SEM-EDS, AFM and a scratch tester. As a result, textured growth of CeO(2), Eu(2)O(3) and Gd(2)O(3) thin films on textured Ni tapes by the sol-gel dip coating process were Successfully performed.