A CMOS Implementation of the Tent Map for Random Number Generation

A new tent map based random number generator (RNG) is designed in TSMC 65 nm CMOS technology. Simulation results verify that the generated random sequences successfully pass the randomness tests in the FIPS-140-2 and NIST 800-22 test suites. Superior to other studies in the literature, our RNG satisfies the randomness tests without post processing. Moreover, the bit generation rate can be increased in exchange of more power consumption. Thus, with the architecture used in this work, robust RNGs needed for security applications can be implemented with higher data rates.