Frustration effect on escape rate in Josephson junctions between single-band and three-band superconductors in the macroscopic quantum tunneling regime

The escape rate of S -> R switching (from superconducting S state to resistive R state) in Josephson junction formed by s-wave single-band (SB) and three-band (ThB) superconductors (SB/ThB junctions) in macroscopic quantum tunneling regime is investigated. We use the effective critical current approximation in SB/ThB junctions. It was shown that escape rate can exhibit qualitative features in the case of frustration effects in ThB superconductors. Inclusion of Leggett modes in ThB superconductors leads to enhancement of escape rate in three-channel Josephson junction in comparison with single-channel junctions.