RAPID-N: Rapid natech risk assessment and mapping framework

Natech accidents at industrial plants are an emerging risk with possibly serious consequences. For the mitigation of natech risk, authorities need to identify natech prone areas in a systematic manner. In order to facilitate probabilistic natech risk mapping, a unified methodology was developed that is based on the estimation of on-site natural hazard parameters, determination of damage probabilities of plant units, and assessment of probability and severity of possibly triggered natech events. The methodology was implemented as an on-line, extensible risk assessment and mapping software framework called RAPID-N, which allows rapid local and regional natech risk assessment and mapping with minimal data input. RAPID-N features an innovative data estimation framework to complete missing input data, such as on-site natural hazard parameters and plant unit characteristics. The framework is also used for damage assessment and natech consequence analysis, and allows easy modification of input parameters, dynamic generation of consequence models according to data availability, and extension of models by adding new equations or substituting existing ones with alternatives. Results are presented as summary reports and interactive risk maps, which can be used for land-use and emergency planning purposes by using scenario hazards, or for rapid natech consequence assessment following actual disasters. As proof of concept, the framework provides a custom implementation of the U.S. EPA's RMP Guidance for Offsite Consequence Analysis methodology to perform natech consequence analysis and includes comprehensive data for earthquakes. It is readily extendible to other natural hazards and more comprehensive risk assessment methods. (C) 2013 Elsevier Ltd. All rights reserved.