Determination of optical constants of silicon photodiode from reflectivity measurements at normal incidence of light

The reflectance of single crystal silicon was carried out at normal angle of incidence in the region from 1 to 5 eV. From these reflectance data, using Kramer-Kronig relations the phase angles between electric fields of incident and reflected waves were calculated. Using the phase angles and Fresnel reflectivity equations, optical constants (n + ik, alpha, epsilon(1)-i epsilon(2),) of silicon were determined. (C) 2006 Elsevier Ltd. All rights reserved.