Published January 1, 2007
| Version v1
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<bold>Raman Spectroscopy and X-ray Diffraction Studies of Stress Effects in PbTiO3 Thin Films</bold>
Creators
- 1. CNRS INPG, Lab Materiaux & Genie Phys, Minatec Batiment INPG,3 Parvis Louis Neel,BP 257, F-38016 Grenoble 1, France
- 2. Inst Ciencia Mat Barcelona, Barcelona, Spain
- 3. Villanova Univ, Dept Gen & Phys, Villanova, PA 19085 USA
Description
The evolution of domain structure and inplane and out-of-plane lattice parameters in PbTiO3 (PTO) films on SrTiO3 (STO), LaAlO3 (LAO) and MgO substrates was studied as a function of film thickness and temperature by X-ray diffraction (XRD). Microstrains and average grain sizes were determined in several crystallographic directions for films of different thicknesses using a Williamson-Hall and Langford analysis. Stress relaxation with film thickness was observed in different domains by Raman spectroscopy and greatly influences lattice parameters. Specific contributions of a- and c-domains on Raman spectra were analyzed and correlated to domains fraction. The high temperature structural phase transition was followed by Raman spectroscopy, showing that the transition depends on the nature of stress.
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